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Details for article 56 of 75 found articles
| Title: |
On robust two-pattern testing of one-dimensional CMOS iterative logic arrays |
| Author: |
Gizopoulos, Dimitris Paschalis, Antonis Nikolos, Dimitris Halatsis, Constantine |
| Appeared in: |
International journal of electronics |
| Paging: | Volume 86 (1999) nr. 8 pages 967-978 |
| Year: |
1999-08-01 |
| Contents: |
In this paper a graph model and a method to construct robust (for the first time in open literature) as well as non-robust two-pattern tests for one-dimensional iterative logic arrays (ILAs) are presented. Exploring the graph structure we can find two-pattern tests that can be applied with a constant or linear number of test vectors to all the ILA cells. Such tests are subsequently characterized as robust or non-robust two-pattern tests. |
| Publisher: |
Taylor & Francis |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 56 of 75 found articles
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