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Details for article 8 of 15 found articles
| Title: |
MOCVD of (Ba,Sr)TiO3: Nucleation and Growth |
| Author: |
Regnery, S. Ehrhart, P. Szot, K. Waser, R. Ding, Y. Jia, C. L. Schumacher, M. Mcentee, T. |
| Appeared in: |
Integrated ferroelectrics |
| Paging: | Volume 57 (2003) nr. 1 pages 1175-1184 |
| Year: |
2003 |
| Contents: |
(Ba0.7Sr0.3)TiO3 and SrTiO3 thin films were deposited on Pt electrodes in a planetary multi-wafer MOCVD reactor. The nucleation behavior and the size of the stable nuclei were investigated by different SPM techniques. Characteristic differences were observed for different deposition temperatures, i.e. a homogeneous nucleation of small BST grains on the larger Pt grains at 565°C and a dominating nucleation at the grain boundaries at 655°C. The micro structural evolution after further film growth was investigated by HRTEM and revealed randomly oriented grains (typical inplane size 10-20 nm) with a high density of twins at 565°C and (100)-oriented defect free grains of only slightly increased size at 655°C. For SrTiO3 the inplane grain size was increased, however, the (100) texture was less perfect. As the electrical properties like permittivity and also leakage current depend on film thickness the final discussions of the electrical properties are based on thickness series (5 nm-100 nm films) and evaluated within the phenomenological dead layer model. |
| Publisher: |
Taylor & Francis |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 15 found articles
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