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Details for article 14 of 47 found articles
| Title: |
Electrochemical models of failure in oxide perovskites |
| Author: |
Desu, Seshu B. Yoo, In K. |
| Appeared in: |
Integrated ferroelectrics |
| Paging: | Volume 3 (1993) nr. 4 pages 365-376 |
| Year: |
1993-12-01 |
| Contents: |
Electrochemical models of failure in oxide perovskite materials are reviewed. It is noted that oxygen vacancies are a common source of electrical degradation, fatigue, and ageing. Taking the behavior of oxygen vacancies into account, a semi-quantitative model for time dependent dielectric breakdown (TDDB) is proposed and a quantitative fatigue mechanism is discussed for ferroelectric thin films. Based on the fatigue theory, a recent improvement in fatigue of ferroelectric thin films is presented. Correlation between leakage current and fatigue is also presented. |
| Publisher: |
Taylor & Francis |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 47 found articles
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