Fink, D. Ghosh, S. Klett, R. Palmetshofer, L. Vacik, J. Hnatowicz, V. Cervena, J. Kaschny, J. Zawislak, F. C. Sanchez, P. Behar, M.
Verschenen in:
Fullerenes, nanotubes & carbon nanostructures
Paginering:
Jaargang 6 (1998) nr. 2 pagina's 175-183
Jaar:
1998-03-01
Inhoud:
The depth profiles of lithium, implanted into fullerene at different fluences and temperatures are reported. They deviate considerably from the simple ballistic predictions. They can be understood in terms of depth dependent Li mobility immediately after the ion implantation. This mobility depends considerably on the temperature and on the degree of fullerene damage. It appears that the fullerene destruction products which act as traps for the mobile lithium are somewhat mobile themselves, essentially at high temperatures, and at low damage levels.