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| Titel: |
Field-ion microscopy |
| Auteur: |
Southworth, H. N. |
| Verschenen in: |
Contemporary physics |
| Paginering: | Jaargang 11 (1970) nr. 3 pagina's 209-226 |
| Jaar: |
1970-05-01 |
| Inhoud: |
Field-ion microscopy is a comparatively new technique for studying the internal structure of solids. It is also unique in that it is able to resolve the individual atoms composing the solid structure. The basic principles of image formation are described at some length, although with the avoidance of complex mathematical detail. Examples are presented of the range of applications of the technique. These include the investigation of lattice defects, and the mechanism of phase transformations and surface reactions. The range of materials able to be studied has recently become greatly increased, and the refinements in technique responsible are discussed. Finally a look is taken at those areas where the future application of field-ion microscopy appears to lie. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 4 van 7 gevonden artikelen
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