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Journal description
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Details for article 2 of 2 found articles
| Title: |
Electron Microscopic and Diffraction Study of Silicon Oxide Film |
| Author: |
SUGATA, E. YOKOYA, H. MAEKAWA, S. EDAGAWA, H. MORITA, Y. |
| Appeared in: |
Journal of electron microscopy |
| Paging: | Volume 10 (1961) nr. 1 pages 20-25 |
| Year: |
1961-NaN |
| Contents: | |
| Publisher: |
Oxford University Press, Oxford |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 2 found articles
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