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  Calculation of the electron density distribution in silicon by the density-functional method. Comparison with X-ray results
 
 
Title: Calculation of the electron density distribution in silicon by the density-functional method. Comparison with X-ray results
Author: Velders, G. J. M.
Feil, D.
Appeared in: Acta crystallographica. Section B, Structural science
Paging: Volume 45 (1989) nr. 4 pages 359-364
Year: 1989-08-01
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 24 found articles
 
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