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Journal description
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Details for article 26 of 53 found articles
| Title: |
Estimating the False Discovery Rate Using Nonparametric Deconvolution |
| Author: |
van de Wiel, Mark A. In Kim, Kyung |
| Appeared in: |
Biometrics |
| Paging: | Volume 63 (2007) nr. 3 pages 806-815 |
| Year: |
2007-09 |
| Contents: | |
| Publisher: |
Blackwell Publishing Inc, Malden, USA |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 26 of 53 found articles
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