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Journal description
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Details for article 11 of 19 found articles
| Title: |
Investigation of profiles of the distribution of ion-implanted Mn atoms using the rutherford back scattering method and the influence of thermal annealing on them |
| Author: |
Egamberdiev, B. E. Kholliev, B. Ch. Mallaev, A. S. |
| Appeared in: |
Surface engineering and applied electrochemistry |
| Paging: | Volume 43 (2007) nr. 2 pages 140-142 |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Allerton Press, Inc., New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 19 found articles
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