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Journal description
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Details for article 19 of 50 found articles
| Title: |
Impacts of BeiDou stochastic model on reliability: overall test, w-test and minimal detectable bias |
| Author: |
Li, Bofeng Zhang, Lei Verhagen, Sandra |
| Appeared in: |
GPS solutions |
| Paging: | Volume 21 (2016) nr. 3 pages 1095-1112 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 50 found articles
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