A risk stratification model for nodal peripheral T-cell lymphomas based on the NCCN-IPI and posttreatment Deauville score
Titel:
A risk stratification model for nodal peripheral T-cell lymphomas based on the NCCN-IPI and posttreatment Deauville score
Auteur:
Yhim, Ho-Young Park, Yong Han, Yeon-Hee Kim, Sungeun Kang, Sae-Ryung Moon, Joon-Ho Jeong, Ju Hye Shin, Ho-Jin Kim, Keunyoung Choi, Yoon Seok Kim, Kunho Kim, Min Kyoung Kong, Eunjung Kim, Dae Sik Eo, Jae Seon Lee, Ji Hyun Kang, Do-Young Lee, Won Sik Lee, Seok Mo Do, Young Rok Ham, Jun Soo Kim, Seok Jin Kim, Won Seog Choi, Joon Young Yang, Deok-Hwan Kwak, Jae-Yong
Verschenen in:
European journal of nuclear medicine and molecular imaging