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                                       Details for article 3 of 30 found articles
 
 
  Correlation between defect-related electroluminescence and charge trapping in Gd-implanted SiO2 layers
 
 
Title: Correlation between defect-related electroluminescence and charge trapping in Gd-implanted SiO2 layers
Author: Prucnal, S.
Sun, J.M.
Nazarov, A.
Tjagulskii, I.P.
Osiyuk, I.N.
Fedaruk, R.
Skorupa, W.
Appeared in: Applied physics. B, Lasers and optics
Paging: Volume 88 (2007) nr. 2 pages 241-244
Year: 2007
Contents:
Publisher: Springer-Verlag, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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 Koninklijke Bibliotheek - National Library of the Netherlands