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Journal description
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Details for article 38 of 62 found articles
| Title: |
Measuring crystal orientation from etched surfaces via directional reflectance microscopy |
| Author: |
Wang, Xiaogang Gao, Shubo Jain, Ekta Gaskey, Bernard Seita, Matteo |
| Appeared in: |
Journal of materials science |
| Paging: | Volume 55 () nr. 25 pages 11669-11678 |
| Year: |
2020-05-05 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 38 of 62 found articles
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