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Journal description
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Details for article 10 of 11 found articles
| Title: |
Test data compression for digital circuits using tetrad state skip scheme |
| Author: |
Sivanandam, Lokesh Oorkavalan, Uma Maheswari Periyasamy, Sakthivel |
| Appeared in: |
Design automation for embedded systems |
| Paging: | Volume 21 (2017) nr. 3-4 pages 197-211 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 11 found articles
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