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                                       Details for article 108 of 156 found articles
 
 
  Noise and Error Analysis and Optimization of a CMOS Latched Comparator
 
 
Title: Noise and Error Analysis and Optimization of a CMOS Latched Comparator
Author: Patnaika, Santosh Kumar
Banerjee, Swapna
Appeared in: Procedia engineering
Paging: Volume 30 (2012) nr. C pages 8 p.
Year: 2012
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 108 of 156 found articles
 
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