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                                       Details for article 70 of 123 found articles
 
 
  Lifetime Degradation on n-type Wafers with Boron-diffused and SiO2/SiN-passivated Surface
 
 
Title: Lifetime Degradation on n-type Wafers with Boron-diffused and SiO2/SiN-passivated Surface
Author: Renevier, Clémentine
Fourmond, Erwann
Forster, Maxime
Parola, Stéphanie
Le Coz, Marine
Picard, Erwann
Appeared in: Energy procedia
Paging: Volume 55 (2014) nr. C pages 7 p.
Year: 2014
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 70 of 123 found articles
 
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