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                                       Details for article 11 of 18 found articles
 
 
  Highly sensitive angular measurement with a Michelson interferometer
 
 
Title: Highly sensitive angular measurement with a Michelson interferometer
Author: Shi, Pan
Stijns, Erik
Appeared in: Industrial metrology
Paging: Volume 1 (1990) nr. 1 pages 6 p.
Year: 1990
Contents:
Publisher: Elsevier Science Publishers B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 11 of 18 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands