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Journal description
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Details for article 9 of 11 found articles
| Title: |
On the Use of Functional Test Generation in Diagnostic Test Generation for Synchronous Sequential Circuits |
| Author: |
Pomeranz, Irith Reddy, Sudhakar M. |
| Appeared in: |
Electronic notes theoretical computer science |
| Paging: | Volume 174 (2007) nr. 4 pages 11 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 11 found articles
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