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Journal description
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Details for article 12 of 26 found articles
| Title: |
Influence of injection rate on carrier lifetime degradation in p-type silicon irradiated by 4.5 MeV electrons |
| Author: |
Bielle-Daspet, D. Pouget, M. |
| Appeared in: |
Nuclear instruments and methods |
| Paging: | Volume 93 (1971) nr. 3 pages 3 p. |
| Year: |
1971 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 26 found articles
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