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Journal description
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Details for article 35 of 157 found articles
| Title: |
Electrical activities of stacking faults and partial dislocations in 4H-SiC homoepitaxial films |
| Author: |
Chen, Bin Chen, Jun Sekiguchi, Takashi Ohyanagi, Takasumi Matsuhata, Hirofumi Kinoshita, Akimasa Okumura, Hajime Fabbri, Filippo |
| Appeared in: |
Superlattices and microstructures |
| Paging: | Volume 45 (2009) nr. 4-5 pages 6 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 35 of 157 found articles
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