|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 10 of 37 found articles
| Title: |
Comparison of SOFC cathode microstructure quantified using X-ray nanotomography and focused ion beam–scanning electron microscopy |
| Author: |
Nelson, George J. Harris, William M. Lombardo, Jeffrey J. Izzo Jr., John R. Chiu, Wilson K.S. Tanasini, Pietro Cantoni, Marco Van herle, Jan Comninellis, Christos Andrews, Joy C. Liu, Yijin Pianetta, Piero Chu, Yong S. |
| Appeared in: |
Electrochemistry communications |
| Paging: | Volume 13 (2011) nr. 6 pages 4 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 37 found articles
| << previous | next >> |