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                                       Details for article 7 of 30 found articles
 
 
  Characterization of structural defects in the silicon crystal grown with various seeds
 
 
Title: Characterization of structural defects in the silicon crystal grown with various seeds
Author: Lee, A Young
Kwan Kim, Young
Appeared in: Materials science in semiconductor processing
Paging: Volume 35 (2015) nr. C pages 6 p.
Year: 2015
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 30 found articles
 
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