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                                       Details for article 9 of 9 found articles
 
 
  The worst of both worlds – the problems with the EMV shift in the US
 
 
Title: The worst of both worlds – the problems with the EMV shift in the US
Author: Bush, Don
Appeared in: Computer Fraud & Security
Paging: Volume 2017 (2017) nr. 1 pages 4 p.
Year: 2017
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 9 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands