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Journal description
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Details for article 2 of 4 found articles
| Title: |
Insight into the genesis of irregularity during crystal growth achieved monochromatic high sensitivity monochromatic synchrotron x-radiation diffraction imaging (topography) |
| Author: |
Steiner, Bruce Kuriyama, Masao Dobbyn, Ronald C. |
| Appeared in: |
Progress in crystal growth and characterization of materials |
| Paging: | Volume 20 (1990) nr. 3 pages 28 p. |
| Year: |
1990 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 4 found articles
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