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                                       Details for article 3 of 18 found articles
 
 
  A step towards accreditation: A robustness test of etching process
 
 
Title: A step towards accreditation: A robustness test of etching process
Author: Leonardi, F.
Veschetti, M.
Tonnarini, S.
Cardellini, F.
Trevisi, R.
Appeared in: Applied radiation and isotopes
Paging: Volume 102 (2015) nr. C pages 5 p.
Year: 2015
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 18 found articles
 
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