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                                       Details for article 8 of 38 found articles
 
 
  Atomic-level stress calculation and surface roughness of film deposition process using molecular dynamics simulation
 
 
Title: Atomic-level stress calculation and surface roughness of film deposition process using molecular dynamics simulation
Author: Hong, Zheng-Han
Hwang, Shun-Fa
Fang, Te-Hua
Appeared in: Computational materials science
Paging: Volume 48 (2010) nr. 3 pages 9 p.
Year: 2010
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 38 found articles
 
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