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                                       Details for article 12 of 22 found articles
 
 
  Numerical analysis of plastic encapsulated electronic package reliability: Viscoelastic properties of underfill resin
 
 
Title: Numerical analysis of plastic encapsulated electronic package reliability: Viscoelastic properties of underfill resin
Author: Sham, Man-Lung
Kim, Jang-Kyo
Park, Joo-Hyuk
Appeared in: Computational materials science
Paging: Volume 40 (2007) nr. 1 pages 9 p.
Year: 2007
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 12 of 22 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands