|
Evolution of microstructure and phase in amorphous, protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry |
|
|
|
Titel: |
Evolution of microstructure and phase in amorphous, protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry |
Auteur: |
Collins, R.W. Ferlauto, A.S. Ferreira, G.M. Chen, Chi Koh, Joohyun Koval, R.J. Lee, Yeeheng Pearce, J.M. Wronski, C.R. |
Verschenen in: |
Solar energy materials and solar cells |
Paginering: |
Jaargang 78 (2003) nr. 1-4 pagina's 38 p. |
Jaar: |
2003 |
Inhoud: |
|
Uitgever: |
Elsevier Science B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|