Characterizing photovoltaic backsheet adhesion degradation using the wedge and single cantilever beam tests, Part I: Field Modules
Titel:
Characterizing photovoltaic backsheet adhesion degradation using the wedge and single cantilever beam tests, Part I: Field Modules
Auteur:
Julien, Scott E. Kempe, Michael D. Eafanti, Joshua J. Morse, Joshua Wang, Yu Fairbrother, Andrew Napoli, Sophie Hauser, Adam W. Ji, Liang O’Brien, Gregory S. Gu, Xiaohong French, Roger H. Bruckman, Laura S. Wan, Kai-tak Boyce, Kenneth P.