Evidence of an identical firing-activated carrier-induced defect in monocrystalline and multicrystalline silicon
Titel:
Evidence of an identical firing-activated carrier-induced defect in monocrystalline and multicrystalline silicon
Auteur:
Chen, Daniel Kim, Moonyong Stefani, Bruno V. Hallam, Brett J. Abbott, Malcolm D. Chan, Catherine E. Chen, Ran Payne, David N.R. Nampalli, Nitin Ciesla, Alison Fung, Tsun H. Kim, Kyung Wenham, Stuart R.