In situ manipulation of the sub gap states in hydrogenated amorphous silicon monitored by advanced application of Fourier transform photocurrent spectroscopy
Titel:
In situ manipulation of the sub gap states in hydrogenated amorphous silicon monitored by advanced application of Fourier transform photocurrent spectroscopy
Auteur:
Melskens, J. Schouten, M. Santbergen, R. Fischer, M. Vasudevan, R. van der Vlies, D.J. Quax, R.J.V. Heirman, S.G.M. Jäger, K. Demontis, V. Zeman, M. Smets, A.H.M.