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                                       Details for article 162 of 171 found articles
 
 
  TIEMF in unirradiated Cu cored MI cables: Microstructure
 
 
Title: TIEMF in unirradiated Cu cored MI cables: Microstructure
Author: Vila, R.
Hodgson, E.R.
Appeared in: Fusion engineering and design
Paging: Volume 82 (2007) nr. 5-14 pages 6 p.
Year: 2007
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 162 of 171 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands