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                                       Details for article 7 of 10 found articles
 
 
  New methods for measuring mechanical properties of thin films in micromachining: Beam pull-in voltage (V PI) method and long beam deflection (LBD) method
 
 
Title: New methods for measuring mechanical properties of thin films in micromachining: Beam pull-in voltage (V PI) method and long beam deflection (LBD) method
Author: Zou, Quanbo
Li, Zhijian
Liu, Litian
Appeared in: Sensors and Actuators. A, Physical
Paging: Volume 48 (1995) nr. 2 pages 7 p.
Year: 1995
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 10 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands