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Journal description
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Details for article 25 of 29 found articles
| Title: |
Total reflection x-ray fluorescence as a sensitive analysis method for the investigation of sputtering processes |
| Author: |
Sekowski, M. Steen, C. Nutsch, A. Birnbaum, E. Burenkov, A. Pichler, P. |
| Appeared in: |
Spectrochimica acta. Part B, Atomic spectroscopy |
| Paging: | Volume 63 (2008) nr. 12 pages 5 p. |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 29 found articles
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