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Journal description
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Details for article 1 of 10 found articles
| Title: |
AFM studies of polypyrrole film surface morphology II. Roughness characterization by the fractal dimension analysis |
| Author: |
Silk, Toomas Hong, Qi Tamm, Jüri Compton, Richard G. |
| Appeared in: |
Synthetic metals |
| Paging: | Volume 93 (1998) nr. 1 pages 7 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 10 found articles
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