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                                       Details for article 10 of 108 found articles
 
 
  Characterization of the field-effect conductivity distribution in pentacene thin-film transistors by a near-field scanning microwave microscope
 
 
Title: Characterization of the field-effect conductivity distribution in pentacene thin-film transistors by a near-field scanning microwave microscope
Author: Babajanyan, Arsen
Melikyan, Harutyun
Carnis, Jerome
Yoon, Youngwoon
Lee, Hanju
Yoo, Hyung Keun
Lee, Kiejin
Friedman, Barry
Appeared in: Synthetic metals
Paging: Volume 161 (2011) nr. 11-12 pages 6 p.
Year: 2011
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 108 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands