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                                       Details for article 13 of 47 found articles
 
 
  A Wiener process model with truncated normal distribution for reliability analysis
 
 
Title: A Wiener process model with truncated normal distribution for reliability analysis
Author: Pan, Donghui
Liu, Jia-Bao
Huang, Fanglun
Cao, Jinde
Alsaedi, Ahmed
Appeared in: Applied mathematical modelling
Paging: Volume 50 (2017) nr. C pages 14 p.
Year: 2017
Contents:
Publisher: Elsevier Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 13 of 47 found articles
 
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