Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 4 of 39 found articles
 
 
  Atom probe specimen fabrication methods using a dual FIB/SEM
 
 
Title: Atom probe specimen fabrication methods using a dual FIB/SEM
Author: Saxey, D.W.
Cairney, J.M.
McGrouther, D.
Honma, T.
Ringer, S.P.
Appeared in: Ultramicroscopy
Paging: Volume 107 (2007) nr. 9 pages 5 p.
Year: 2007
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 39 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands