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Journal description
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Details for article 11 of 14 found articles
| Title: |
XPS determination of the isoelectric point of solid surfaces: possible improvements to the method of Simmons and Beard |
| Author: |
Delamar, Michel |
| Appeared in: |
Journal of electron spectroscopy and related phenomena |
| Paging: | Volume 67 (1994) nr. 3 pages nvt p. |
| Year: |
1994 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 14 found articles
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