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Journal description
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Details for article 13 of 21 found articles
| Title: |
Spectral fit refinement in XPS analysis technique and its practical applications |
| Author: |
Boryakov, A.V. Surodin, S.I. Kryukov, R.N. Nikolichev, D.E. Zubkov, S.Yu. |
| Appeared in: |
Journal of electron spectroscopy and related phenomena |
| Paging: | Volume 229 (2018) nr. C pages 132-140 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 21 found articles
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