Chemical interaction at the buried silicon/zinc oxide thin-film solar cell interface as revealed by hard X-ray photoelectron spectroscopy
Titel:
Chemical interaction at the buried silicon/zinc oxide thin-film solar cell interface as revealed by hard X-ray photoelectron spectroscopy
Auteur:
Wimmer, M. Gerlach, D. Wilks, R.G. Scherf, S. Félix, R. Lupulescu, C. Ruske, F. Schondelmaier, G. Lips, K. Hüpkes, J. Gorgoi, M. Eberhardt, W. Rech, B. Bär, M.
Verschenen in:
Journal of electron spectroscopy and related phenomena