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Journal description
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Details for article 292 of 3530 found articles
| Title: |
Auger-electron-photoion coincidence studies on ionic fragmentation following the Si 2p ionization of SiF4 |
| Author: |
Shigemasa, E. Hayaishi, T. Okuno, K. Danjo, A. Ueda, K. Sato, Y. Yagishita, A. |
| Appeared in: |
Journal of electron spectroscopy and related phenomena |
| Paging: | Volume 79 (1996) nr. C pages 4 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 292 of 3530 found articles
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