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Journal description
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Details for article 72 of 660 found articles
| Title: |
An X-ray photoelectron spectroscopy study of BaAl2S4 thin films |
| Author: |
Smet, Philippe F. Van Haecke, Jo E. Van Meirhaeghe, Roland L. Poelman, Dirk |
| Appeared in: |
Journal of electron spectroscopy and related phenomena |
| Paging: | Volume 148 (2005) nr. 2 pages 5 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 72 of 660 found articles
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