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Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES |
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Title: |
Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES |
Author: |
Schneider, C.M. Wiemann, C. Patt, M. Feyer, V. Plucinski, L. Krug, I.P. Escher, M. Weber, N. Merkel, M. Renault, O. Barrett, N. |
Appeared in: |
Journal of electron spectroscopy and related phenomena |
Paging: |
Volume 185 (2012) nr. 10 pages 10 p. |
Year: |
2012 |
Contents: |
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Publisher: |
Elsevier B.V. |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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