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  Expected warranty cost of two-attribute free-replacement warranties based on a bivariate exponential distribution
 
 
Title: Expected warranty cost of two-attribute free-replacement warranties based on a bivariate exponential distribution
Author: Kim, H.-G
Rao, B.M
Appeared in: Computers & industrial engineering
Paging: Volume 38 (2000) nr. 4 pages 10 p.
Year: 2000
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 1 of 7 found articles
 
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