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                                       Details for article 30 of 186 found articles
 
 
  Charge collection and soft error in DRAMs investigated using 400 keV proton microprobe
 
 
Title: Charge collection and soft error in DRAMs investigated using 400 keV proton microprobe
Author: Sayama, H.
Kimura, H.
Ohno, Y.
Sonoda, K.
Kotani, N.
Satoh, S.
Takai, M.
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 85 (1994) nr. 1-4 pages 703-707
Year: 1994
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 30 of 186 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands