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Journal description
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Details for article 4 of 13 found articles
| Title: |
Auger electron depth profiling of the Cr Al2O3 metallization system |
| Author: |
Lu, Hua Cui, Y.D. Qin, J. Bao, C.L. Shen, D.H. |
| Appeared in: |
Applied surface science |
| Paging: | Volume 103 (1996) nr. 2 pages 13 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 13 found articles
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