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Journal description
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Details for article 28 of 35 found articles
| Title: |
Sensitivity of V-shaped atomic force microscope cantilevers based on a modified couple stress theory |
| Author: |
Lee, Haw-Long Chang, Win-Jin |
| Appeared in: |
Microelectronic engineering |
| Paging: | Volume 88 (2011) nr. 11 pages 5 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 28 of 35 found articles
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