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                                       Details for article 57 of 57 found articles
 
 
  Ti-silicide formation during isochronal annealing followed by in situ ellipsometry
 
 
Title: Ti-silicide formation during isochronal annealing followed by in situ ellipsometry
Author: Stark, T.
Gutowski, L.
Herden, M.
Grünleitner, H.
Köhler, S.
Hundhausen, M.
Ley, L.
Appeared in: Microelectronic engineering
Paging: Volume 55 (2001) nr. 1-4 pages 7 p.
Year: 2001
Contents:
Publisher: Elsevier Science B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 57 of 57 found articles
 
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