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                                       Details for article 167 of 183 found articles
 
 
  Static contact micro four-point probes with <11nm positioning repeatability
 
 
Title: Static contact micro four-point probes with <11nm positioning repeatability
Author: Petersen, Dirch H.
Hansen, Ole
Hansen, Torben M.
Petersen, Peter R.E.
Bøggild, Peter
Appeared in: Microelectronic engineering
Paging: Volume 85 (2008) nr. 5-6 pages 4 p.
Year: 2008
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 167 of 183 found articles
 
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